江波龙：公司MLC NAND Flash样品处于测试阶段，尚未产生规模化销售收入

金融界2月19日消息，有投资者在互动平台向江波龙提问：董秘，您好，请问32Gb2DMLCNANDFlash什么时候可以量产出货呢？预计市场份额如何？是否已有友商提前下订单了呢？

公司回答表示：公司MLC NAND Flash样品目前处于测试过程中，距离量产还需一段时间，相关在先宣传资料等，均已明确提示尚未产生规模化销售收入，请您留意投资风险。

本文源自金融界AI电报

MK米客方德品牌SD NAND 可靠性验证测试

SD NAND 可靠性验证测试的重要性

SD NAND可靠性验证测试至关重要。通过检验数据完整性、设备寿命、性能稳定性，确保产品符合标准，可提高产品的可信度、提高品牌声誉，减少维修成本，确保产品质量和市场竞争力。MK-米客方德是一家做存储的公司，是SD NAND技术的引领者，工业应用的领导品牌。其公司SD NAND产品都有可靠性验证测试报告，

SD NAND 可靠性验证测试报告

以MK-米客方德工业级SD NAND的MKDN064GCL-ZA型号为例，下面是可靠性验证测试的具体项目。

『Test Summary』

No

Test Item

Description

Result

1

Card Density Check

90%

Pass

2

Performance Test

HDBench/CrystalDiskMark/H2test

---

3

Compliance Test

TestMetrix VTE3100/VTE4100

Pass

4

Speed Class Test

TestMetrix VTE3100/VTE4100

Pass

5

Full Size Copy/Compare

H2test

Pass

6

Burn-in Test

BIT @-25~ 85’C

Pass

7

NPOR Test

Normal power cycle test when card is stand by

Pass

8

SPOR Test

Sudden power cycle test when card is busy

Pass

9

Read Only Test

H2test

Pass

10

IR-Reflow

260 ’C, check SLC data

Pass

11

Power consumption

Write & Read current measurement

---

Test Item

Test Tool & Environment

SD FormatterWin7 OS

Sample Quantity

1ea

Result

7374MB, 90%

Test Tool & Environment

HDBench Ver3.40 / CrystalDiskMark 6.0 / IO meter / H2 testCard Reader : Transcend TS-RDP5K (GL834)Win7 OS

Test Criteria

Depends on customer criteria

Sample Quantity

2ea

Result

Pass (see 2.4 performance data)

Test Tool & Environment

1. IO Meter 2006.07.27

Card Reader : Transcend TS-RDP5K (GL834)Win7 OS

Test Criteria

Depends on customer criteria

Sample Quantity

2ea

Result

Pass (see 2.4 performance data)

Test Tool & Environment

1. TestMetrix VTE3100/VTE4100

Test Criteria

Depends on customer criteria

Sample Quantity

3ea

Result

Pass (see 2.4 performance data)

Test Item

Test Mode

Result

HDBench (100MB)

Sequential Read (MB/s)

46.2

Sequential Write (MB/s)

24.2

CrystalDiskMark (100MB)

Sequential Read (MB/s)

47.5

Sequential Write (MB/s)

26

IOMeter (100MB)

Random Write (IOPS)

572.6

Random Read (IOPS)

1119.5

TestMetrix

Sequential Read (MB/s)

24.4

Sequential Write (MB/s)

10

H2test

Sequential Read (MB/s)

40.6

Sequential Write (MB/s)

10

Test Tool & Environment

TestMetrix VTE3100/VTE4100

Test Criteria

Test done without error

Sample Quantity

3ea

Result

Pass

Test Tool & Environment

1. TestMetrix VTE3100/VTE4100

Test Criteria

Pass class 6 condition

Sample Quantity

3ea

Result

Pass

Speed Class

Test Mode

Result

Class6

Pw (MB/s)

8.5

Pr (MB/s)

9.6

Test Tool & Environment

H2test v1.4Card Reader : Transcend TS-RDP5K (GL834)Win7 OS

Test Criteria

Test done without no error

Sample Quantity

2ea

Result

Pass

BIT v8.0

Test Tool & Environment

BurnInTest v8.0Card Reader : Transcend TS-RDP5K (GL834)Win7 OS

Test Criteria

168hours without error @25/85/-25’C

Sample Quantity

Total 6ea

Result

Pass

Test Tool & Environment

1. MK NPOR Tool

Test Criteria

Pass 10K cycles

Sample Quantityv

2ea

Result

Pass

Test Tool & Environment

1. MK SPOR Tool – 5%/95% non-file system

Test Criteria

Pass 10K cycles

Sample Quantity

2ea

Result

Pass

Test Tool & Environment

1. Specific SPOR Tool – small/large file system based

Test Criteria

Pass 10K cycles

Sample Quantity

2ea

Result

Pass

Test Tool & Environment

H2testCard Reader : Transcend TS-RDP5K (GL834)Win7 OS

Test Criteria

72hours without error

Sample Quantity

4ea

Result

Pass

Test Tool & Environment

IR-reflow 260 ‘C

Test Criteria

3 times test and check all data without error

Sample Quantity

10ea

Result

pass

Test Tool & Environment

CrystalDiskMark 6.0Card Reader : Transcend TS-RDP5K (GL834)Win7 OSAgilent U1252B

Item

Standby

current(uA)

Operating

current (mA)

Throughput (MB/s)

#1

210

Read

96

47.6

Write

81

26.6

#2

211

Read

95

47

Write

83

26.8

#3

210

Read

96

48

Write

81

27

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